Focused Ion Beam Market Driven by increasing demand for precision material processing and failure analysis in the semiconductor and electronics industriesAustin, May 09, 2025 (GLOBE NEWSWIRE ...

Focused ion beams or FIB are generated to focus on the point source’s image by using electrostatic lenses onto a substrate and then its precise deflection. These beams usually have a diameter ...

Ion beam lithography is used to create fine nanostructures on a surface, such as circuit boards. It can be used to directly write on the material, rather than using a photomask, as in ...

ALBANY, N.Y. — Researchers at a UAlbany lab got a major boost of federal funds.NEWS10 went underground to see how it will be put to use. Buried deep below the ground on UAlbany’s uptown campus ...

Helium ion beam (HIB) technology plays an important role in the extreme fields of nanofabrication. Due to high resolution and sensitivity, HIB nanofabrication technology is widely used to pattern ...

Utilizing Secondary Ion Mass Spectrometry (SIMS) for in-line metrology is a newly emerging method of process control that requires contamination-free measurements, enabling SIMS on product wafers.

Time and spatially-resolved ion beam irradiation techniques play an important role in modifying the properties and patterning of several classes of materials. Over the past decade there has been a ...