The electron microscopy techniques of widefield, laser scanning and focussed ion beam scanning electron microscopy are ... High-resolution imaging is the goal of field emission SEMs. The electron ...

Field-emission microscopy (FEM) is an analytical technique used in materials science to investigate molecular surface structures and their electronic properties. Invented by Erwin Wilhelm Müller in ...

Combine field emission ... microscope. An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion ...

Acquired using the Zeiss Ultra Plus charge compensation system and low kv. Carbon nanotubes imaged using the in-lens secondary detector at low kv. Copper oxide nanoparticles imaged using the scanning ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...